Courses:

The electron microprobe provides a complete micron-scale quantitative chemical analysis of inorganic solids. The method is nondestructive and utilizes characteristic X-rays excited by an electron beam, incident on a flat surface of the sample. This course provides an introduction to the theory of X-ray microanalysis by wavelength and energy dispersive spectrometry (WDS and EDS), ZAF matrix correction procedures and different imaging techniques including scanning backscattered electron (BE), scanning secondary electron (SE), scanning X-ray (by WDS or EDS, also known as compositional or elemental maps), and scanning cathodoluminescence (CL) imaging. Lab sessions involve hands-on use of the JEOL JXA-733 Superprobe.

• Electron-specimen Interactions
  • Elastic Scattering: Electron Backscattering
  • Inelastic Scattering: Secondary Electron Excitation
    • Continuum X-ray Generation, Characteristic X-ray Generation
  • Interaction Volume
• Matrix Corrections
  • Atomic Number, Absorption and Characteristic Fluorescence Corrections
  • Continuum Fluorescence Correction
  • Φ(ρz) Corrections

Goldstein, J. I., D. E. Newbury, P. Echlin, D. C. Joy, A. D. Romig Jr., C. E., Lyman, C. Fiori, and E. Lifshin. Scanning Electron Microscopy and X-ray Microanalysis: A Text for Biologists, Material Scientists, and Geologists. 2nd ed. New York, NY: Plenum Press, 1992.

Reed, S. J. B. Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. Cambridge, UK: Cambridge Univ. Press, 1996.

Scott, V. D., G. Love, and S. J. B. Reed. Quantitative Electron-Probe Microanalysis. 2nd ed. New York, NY: Ellis-Horwood, 1995.

The basis for the grade is completion of all the lab exercises (problem sets) and correctly solving problem 3B.